Contrast analysis of cryo-images of n-paraffin recorded at 400
kV out to 2.1 Å resolution. J. Microscopy161:279-295.
Rez, P., Chiu, W., Weiss, J.K. and Brink, J. (1991)
The thickness determination of organic crystals under low dose conditions
using electron energy loss spectroscopy. Microsc. Res. Tech.21:166-170.
Brink, J., Chiu, W. and Dougherty, M. (1992)
Computer-controlled spot-scan imaging of crotoxin complex crystals
with 400 keV electrons at near-atomic resolution. Ultramicroscopy, 46:229-240.
Leapman, R.D., Brink, J. and Chiu, W. (1993)
Low-dose thickness measurement of glucose-embedded crystals crystals
by electron energy loss spectroscopy and STEM dark-field imaging. Ultramicroscopy, 52:157-166.